Sorting handler for burn-in tester

ABSTRACT

Sorting handler for a burn-in tester including two DC testing parts and two unloading buffers on opposite sides of a burn-in board at a working post in a line with a main working line respectively, one pair of a loader part for supplying new devices and an unloader part for receiving tested good devices on each of side parts of a body, so that two insert/remove pickers carry out a work continuously in which two insert/remove pickers move along the main working line in both directions with reference to the burn-in board, to remove the devices from the burn-in board, and insert devices to be tested in the space in turn, thereby improving a test productivity per a unit time period.

This application claims the benefit of the Korean Application No.P2003-0064836 filed on Sep. 18, 2003, which is hereby incorporated byreference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to sorting handlers for testing electriccharacteristics of a device, such as a semiconductor device of whichproduction is finished, and more particularly, to a sorting handler fora burn-in tester for carrying out a burn-in test that is a heatresistance test carried out before shipment of the device to minimizeoccurrence of defect at the device caused by heat generated during useof the device applied to a product.

2. Background of the Related Art

In general, devices, such as semiconductor devices, are assured ofproduct reliability by testing various electric performances of finisheddevices at a tester, and only shipping good products as a result of thetest.

For minimizing occurrence of the defect due to heat under an actualenvironment of use, the burn-in test is carried out as one of devicetests. The sorting handler for a burn-in tester is an apparatus forcarrying out a series of works of unloading the device tested at theburn-in tester from a test board, sorting at shipment trays according toa result of the test, and loading new devices to be tested on the testboard, automatically.

The Korean Laid Open Patent No. 2000-0065749 (Published on Nov. 15,2000) which is applied, and registered by the applicant discloses asorting handler for a burn-in tester which enables size and system ofthe apparatus compact, makes exchange of trays at a sorting part easier,and shortens a test time period.

FIG. 1 illustrates a diagram of the sorting handler for a burn-in testerschematically, provided with a loader part 3 in one side part of a body1 having trays mounted thereon for receiving devices to be tested newly,an unloader part 4 opposite to the loader part 3 having trays mountedthereon for receiving good devices as a result of the burn-in test, anda sorting part 5 between the loader part 3 and a front part of theunloader part 4 having trays mounted thereon for receiving defective, orre-test devices as the result of the burn-in test.

There are a rack 2 on one side of the body 1 for supplying burn-inboards ‘B’ having burn-in tested devices loaded thereon, and an X-Y-θtable under the body 1 for drawing the burn-in board ‘B’ from the rack2, introducing the burn-in board ‘B’ to an inner side of the body 1,returning the burn-in board ‘B’ to an original position of the rack 2,and moving the burn-in board in an X or a Y direction by one step at aworking position.

There are a DC testing part 8 at a side of the loader part 3, anunloading buffer 10 at one side of the unloader part 4, and a workingspace between the DC testing part 8 and the unloading buffer 10 wherethe burn-in board ‘B’ is positioned.

There is an X-axis main shaft 6 crossing the body 1 over the DC testingpart 8, the burn-in board ‘B’, and the unloading buffer 20, having aloading picker 11 for transferring the devices from the loader part 3 tothe DC testing part 8, an insert picker 12 and a remove picker 13 fortransferring the devices from the DC testing part 8 to the burn-in board‘B’, and from the burn-in board ‘B’ to the unloading buffer 10, and anunloading picker 14 for transferring the devices from the unloadingbuffer 10 to the unloader part 4. The insert picker 12 and the removepicker 13 are coupled to a slider (not shown) moving along the X-axismain shaft 6, to moving along the X-axis main shaft 6 together.

There is a sorting picker 15 arranged over the sorting part 5 to movealong sorting X-, and Y-axis shafts 7 for transferring defective devicesfrom the DC testing part 8 and the unloading buffer 10 to the sortingpart 5.

There is a tray transfer 18 arranged in a rear part of the loader part 3and the unloader part 4 to move along a tray transfer X-axis shaft 19for transferring empty trays having all devices loaded on the loaderpart 3 to the unloader part 4.

The operation of the related art sorting handler for a burn-in testerwill be described.

When a worker loads burn-in tested burn-in boards on the rack, and putsthe handler into operation, the X-Y-θ table 20 moves toward the rack 2,draws one of the burn-in boards ‘B’ from the rack 2, moves to thecentral working space of the body 1, and turns the burn-in board at 90°.

Then, the tray ‘T’ at the loader part 3 moves backward to a positionunder the X-axis main shaft 6, and the loading picker 11 holds thedevice at the loader part 3, and moves to the DC testing part 8. Asimple DC test is carried out at the DC testing part 8, when the loadingpicker 11 moves to the loader part 3 again, and holds the next devicefor transferring to the DC testing part 8.

When the DC test is finished at the DC testing part 8, both the insertpicker 12 and the remove picker 13 respectively move to positions overthe DC testing part 8 and the burn-in boards ‘B’ at the same time. Then,the insert picker 12 holds the device at the DC test part 8, and theremove picker 13 holds the burn-in tested device on the burn-in board‘B’ of the remove picker 13.

Both the insert picker 12 and the remove picker 13 move to left when thedrawing is seen from above, load the devices on the burn-in board ‘B’and the unloading buffer 10, and move to the DC testing part 8 and theburn-in board ‘B’, again, respectively.

Then, the unloading picker 14 transfers the burn-in tested good deviceson the unloading buffer 10 to the tray ‘T’ on the unloader part 4. Ifthere is any defective device on the unloading buffer 10, the sortingpicker 15 moves to the unloading buffer 10 along the sorting X-, andY-axis shafts 7, holds the defective device, and loads on the tray ‘T’on the sorting part 5.

If all the burn-in tested devices are removed from the burn-in board‘B’, and new devices are stuffed thereon, the X-Y-θ table 20 transfersthe burn-in board ‘B’ to an original position of the rack 2.

In the meantime, the related art sorting handler for a burn-in testerhas a drawback in that, after the insert picker 12 and the remove picker13 transfer the devices from the DC testing part 8 and the burn-in board‘B’ to the burn-in board and the unloading buffer 10, the insert picker12 and the remove picker 13 return to the positions of the DC testingpart 8 and the burn-in board ‘B’ again, with empty handed, i.e., withoutany real work, that makes both working efficiency, and test productivityper unit time period (UPH=units per hour) poor.

The unidirectional work flow of the related art sorting handler for aburn-in tester, in which only device loading is made in one side part ofthe handler body, and only device unloading is made in the other sidepart of the handler body, results in a poor work efficiency.

To cope with this drawback, the applicant discloses a sorting handlerfor a burn-in tester in the Korean Laid Open Patent No. 2000-0067665(Laid Open on Nov. 25, 2000) suggesting two DC testing parts and thebuffers arranged in symmetry with reference to burn-in board to progressdevice loading/unloading in both side parts of the body simultaneously,for reducing a testing time period, and improving working efficiency.

However, the foregoing sorting handler for a burn-in tester has adrawback in that the working time period can be reduced and the workingefficiency can be improved only when one kind of work is selected, andcarried out at the both side parts simultaneously during the deviceloading and unloading.

In other words, the working efficiency can be improved by using the bothside parts as the loader parts, or the unloader parts when the sortinghandler for a burn-in tester carries out loading work only in which anew device is loaded on the burn-in board, or unloading work only inwhich the device is transferred from the burn-in board to the tray.

However, since it is impossible that the pickers pick up a device fromthe burn-in board and putting a new device to be tested on the space atthe same time while the pickers move along the X-axis main shaft overboth side parts of the burn-in board, such a work can not but beunidirectional, that results in a poor testing work efficiency.

SUMMARY OF THE INVENTION

Accordingly, the present invention is directed to a sorting handler fora burn-in tester that substantially obviates one or more of the problemsdue to limitations and disadvantages of the related art.

An object of the present invention is to provide a sorting handler for aburn-in tester, which enables to eliminate a loose working time periodof the pickers, for improving a testing productivity per a unit timeperiod (UPH).

Additional features and advantages of the invention will be set forth inthe description which follows, and in part will be apparent to thosehaving ordinary skill in the art upon examination of the following ormay be learned from practice of the invention. The objectives and otheradvantages of the invention will be realized and attained by thestructure particularly pointed out in the written description and claimshereof as well as the appended drawings.

To achieve these objects and other advantages and in accordance with thepurpose of the present invention, as embodied and broadly describedherein, the sorting handler for a burn-in tester includes a burn-inboard loading part for loading a plurality of burn-in boards each forloading devices to be burn-in tested thereon, a first loader part in oneside part of the body for transferring trays on a first loading stacker,having devices to be tested newly loaded thereon, to a first loadingposition in succession, a first unloader part arranged on one side of,and parallel to the first loader part for transferring empty trays to anunloading position on a side of the first loading position insuccession, to receive, and loading good burn-in tested devices on afirst unloading stacker, a second loader part opposite to, and spaced adistance away from the first loader part and the first unloader part fortransferring trays having devices to be tested newly placed thereon froma second loading stacker to a second loading position in a line with,and opposite to the first loading position in succession, a secondunloader part on one side of, and parallel to the second loader part fortransferring empty trays to a second unloading position on a side of thesecond loading position in succession, to receive, and loading goodburn-in tested devices on a second unloading stacker, a sorting part forstacking trays having defective devices loaded thereon, a working postin a line with, and between the first loading and unloading position,and the second loading and unloading position, for placing the burn-inboard transferred from the burn-in board loading part, a burn-in boardtransfer table under the body, for moving the burn-in board in an X-,Y-, or θ direction under the working post, a first DC testing part in aline with, and between the working post and the first loading, andunloading position for carrying out DC test of the devices from thefirst loader part, a first buffer part on one side of the first DCtesting part for placing tested devices from the burn-in board, or newdevices from the first loader part thereon, a second DC testing part ina line with, and between the working post and the second loading, andunloading position for carrying out DC test of the devices from thesecond loader part, a second buffer part on one side of the second DCtesting part for placing tested devices from the burn-in board, or newdevices from the second loader part thereon, an X-axis main shaft over,and across the first loading, unloading position, the working post, andthe second loading and unloading position, a first loading/unloadingpicker movable along the X-axis main shaft, for transferring the devicesfrom the trays at the first loading position to the DC testing part, andloading the devices on the first DC testing part, and transferring thedevices from the first buffer part to the trays at the first unloadingposition and loading the device on the first unloading position, asecond loading/unloading picker movable along the X-axis main shaft, fortransferring the devices from the trays at the second loading positionto the second DC testing part, and loading the devices on the first DCtesting part, and transferring the devices from the second buffer partto the trays at the second unloading position and loading the device onthe second unloading position, a first insert/remove picker movablealong the X-axis main shaft between the first, and secondloading/unloading pickers, for transferring devices between the burn-inboard at the working post, and the first DC testing part and the firstbuffer part, a second insert/remove picker movable along the X-axis mainshaft between the first, and second loading/unloading pickers, fortransferring devices between the burn-in board, and the second DCtesting part and the second buffer part, and a sorting picker fortransferring devices other than good devices from the first, and secondDC testing parts and the first, and second buffer parts to the sortingpart.

It is to be understood that both the foregoing description and thefollowing detailed description of the present invention are exemplaryand explanatory and are intended to provide further explanation of theinvention claimed.

BRIEF DESCRITPION OF THE DRAWINGS

The accompanying drawings, which are included to provide a furtherunderstanding of the invention and are incorporated in and constitute apart of this application, illustrate embodiment(s) of the invention andtogether with the description serve to explain the principle of theinvention. In the drawings;

FIG. 1 illustrates a plan view of a related art sorting handler for aburn-in tester, schematically;

FIG. 2 illustrates a plan view of a sorting handler for a burn-in testerin accordance with a preferred embodiment of the present invention,schematically; and

FIG. 3 illustrates a perspective view of the DC testing part and theunloading buffer of the sorting handler for a burn-in tester in FIG. 2.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

Reference will now be made in detail to the preferred embodiments of thepresent invention, examples of which are illustrated in the accompanyingdrawings. FIG. 2 illustrates a plan view of a sorting handler for aburn-in tester in accordance with a preferred embodiment of the presentinvention schematically, and FIG. 3 illustrates a perspective view ofthe DC testing part and the unloading buffer of the sorting handler fora burn-in tester in FIG. 2.

Referring to FIGS. 2 and 3, the sorting handler for a burn-in testerincludes a rack 200 on one side of a body 101 for loading a plurality ofburn-in boards ‘B’, a first loader part 110 in one side part of the body101 for transferring trays ‘T’ on a first loading stacker 111, havingdevices to be tested newly loaded thereon to backward in succession, anda first unloader part 115 arranged on a right a side of, and parallel tothe first loader part 110 for transferring the tray from a tray stacker117 in a rear part to a front part, and receiving, and loading goodburn-in tested devices on a first unloading stacker 116 in the frontpart.

Opposite to the first loader part 110 and the first unloader part 115,there are a second loader part 120 for transferring the trays ‘T’ from asecond loading stacker 121 to a rear part in succession, and a secondunloader part 125 for transferring the trays from a tray stacker 127 inthe rear part in succession, both of which have the same system with thefirst loader part 110 and the first unloader part 115, respectively.

Though not shown, the trays on the first, and second loader parts 110,and 120 and the first, and second unloader parts 115, and 125 can bemoved linearly as much as desired to/from front/rear parts of the body101 by using known linear moving systems, such as belt systems withtiming belts, and guide devices, such as LM guides, appropriately.

In the meantime, there is a sorting part 150 in the front part of thebody 101 for loading trays for receiving defective devices as results ofburn-in test, and DC test.

There is an X-Y-θ table 105 under the body 101 for transferring theburn-in board ‘B’ from the rack 200 to a working position inside of thebody 101, and transferring the burn-in board having a work thereonfinished to an original position at the rack 200. In addition to thetransferring of the burn-in boards, the X-Y-θ table 105 inverts a phaseof the burn-in board to 0° and ±90° depending on a direction of thedevice at a working post in a central part of the body, and moves theburn-in board ‘B’ in an X-axis, or Y-axis direction by one stepaccording to a sequence in device insertion or removal.

In the meantime, there are the working post WP in the central part ofthe body 101 for placing the burn-in board ‘B’ transferred from the rack200 by the X-Y-θ table 105, and carrying out device inserting andremoval, a first DC testing part 131 and a second DC testing part 132 onopposite sides of the working post WP for carrying out DC test of adevice to be burn-in tested newly, and a first unloading buffer 141 anda second unloading buffer 142 in the vicinity of the first DC testingpart 131 and the second DC testing part 132, respectively.

The first, and second DC testing parts 131, and 132, and the first, andsecond unloading buffers 141, and 142 are shifted by main pneumaticcylinder 135 in a line with, and between a position of the working postWP, i.e., a position in a main working line, and a position in a sortingline SL where defective device sorting is carried out.

The first, and second unloading buffers 141, and 142 shift togetherbetween the main working line ML and the sorting line SL by the mainpneumatic cylinders 135, and move individually from the main workingline ML to the sorting line SL by preset distances by individualpneumatic cylinders 145 for transferring a buffer having defectivedevice loaded thereon to the sorting line SL.

There is an X-axis main shaft 160 over the main working line ML acrossthe first, and second DC testing parts 131, and 132, the working postWP, the first, and second loader parts 110, and 120, and the first, andsecond unloader parts 115, and 125.

There are a first loading/unloading picker 161 in one end part of theX-axis main shaft 160 for moving, and transferring devices between thefirst loader part 110 and the first unloader part 115, and the first DCtesting part 131 linearly, and a second loading/unloading picker 164 inthe other end part of the X-axis main shaft 160 for moving, andtransferring devices between the second loader part 120 and the secondunloader part 125, and the second DC testing part 132, linearly.

There are a first insert/remove picker 162, and a second insert/removepicker 163 between the first loading/unloading picker 161 and the secondloading/unloading picker 164 for transferring devices between burn-inboards at the first, and second DC testing parts 131, and 132, or thefirst, and second unloading buffers 141, and 142 and the working postWP. Each of the first, and second insert/remove pickers 162, and 163 isconnected to a slider 166 arranged to move along the X-axis main shaft160, thereby making linear reciprocating movement following the movementof the slider 166.

There is a sorting picker 165 arranged over the sorting part 150 to movealong sorting X-, and Y-axis shafts 170 for transferring defectivedevices from the first, and second DC testing parts 131, and 132, andthe first, and second unloading buffers 141, and 142.

The first, and second loading/unloading pickers 161, and 164, the first,and second insert/remove pickers 162, and 163, and the sorting picker165 move, not only horizontally, but also in up/down direction atrespective designated positions, for picking up/releasing the devices.

Though not shown, as means for moving the first, and secondloading/unloading pickers 161, and 164, the first, and secondinsert/remove pickers 162, and 163, and the sorting picker 165 ahorizontal direction and up/down direction linearly, a variety of knownlinear motion mechanisms, such as a linear motion system with a linearmotor, or a ball screw and servo motor, or a linear motion system with abelt or chain, or the like may be employed appropriately suitable touser requirements.

In the meantime, it is preferable that there are tray stackers 112, and117, and a first tray transferor 181 in a rear part of the first loaderpart 110, and the first unloader part 115, for transferring empty traysfrom the tray stacker of the first loader part 110 to the tray stacker117 of the first unloader part 115.

Identical to this, there may be tray stackers 122, and 127, and secondtray transferor 182 in a rear part of the second loader part 120 and thesecond unloader part 125.

The operation of the sorting handler in a burn-in tester of the presentinvention will be described.

When a worker loads trays having devices to be burn-in tested newlythereon on the first loading stacker 111 of the first loader part 110,and the second loading stacker 121 of the second loader part 120, andloads cassette (not shown) having burn-in tested burn-in boards ‘B’thereon on the rack 200, and putting the sorting handler into operation,the X-Y-θ table 105 moves toward the rack 200, draws one of the burn-inboards stacked on the rack 200, moves to the working post WP in the body101, turns at 90° to change length/height directions of the burn-inboard ‘B’, and stands by at a working post.

In this instance, right before the burn-in board ‘B’ is transferred tothe working post in the body 101, a connection terminal C at one end ofthe burn-in board ‘B’ is connected to a connector (not shown) at thebody 101, so that information on the burn-in board is given to acontrolling unit (not shown) of the sorting handler, and test results ofthe devices on the burn-in board ‘B’ are shared through a network.

Then, the tray ‘T’ at the lowest position is separated from the firstloading stacker 111, and transferred to the main working line ML, andthe tray ‘T’ at the lowest position is separated from the second loadingstacker 121, and transferred to the main working line ML, too.

In this instance, the trays on the tray stackers 117, and 127 in therear parts of the first, and second unloader parts 115, and 125 areseparated in succession starting from trays at the lowest positions,transferred to, and stand by at the main working line ML.

Moreover, the first, and second testing parts 131, and 132 are alignedwith the main working line.

Once the trays on the first loader part 110 and the second loader part120 are aligned with the main working line, the first loading/unloadingpicker 161 moves over the trays on the first loader part 110 on theright side when the drawing is seen from above, holds the devices, andmoves to the left side when the drawing is seed from above again, placesthe devices on the first DC testing part 131, for progressing device DCtest at the first DC testing part 131.

At the same time with this, the second loading/unloading picker 164 alsomoves to the second loader part 120, holds the devices, transfers thedevices to the second DC testing part 132, for progressing device DCtest. The main pneumatic cylinders 135 are come into operation as the DCtest of the devices are finished at the second DC testing part 132, sothat the second unloading buffer 142 are on standby in a state thesecond unloading buffer 142 is align with the main working line ML.

The slider 166 moves to right one the drawing when the drawing is seenfrom above if the DC test of the devices are finished at the first DCtesting part 131, so that the second insert/remove picker 163 ispositioned over the burn-in board ‘B’ at the working post WP, and thefirst insert/remove picker 162 is positioned over the first DC testingpart 131.

Then, both the first, and second insert/remove pickers 162, and 163 movedown at the same time, the first insert/remove picker 162 holds devicesat the first DC testing part 131, to be tested newly, and the secondinsert/remove picker 163 holds the burn-in tested devices on the burn-inboard ‘B’.

Then, the first, and second insert/remove pickers 162, and 163 move to aleft side of the drawing when the drawing is seen from above, togetherwith the slider 166.

In the meantime, once the first, and second insert/remove pickers 162,and 163 move to the left side of the drawing, the firstloading/unloading picker 161 moves to the first loader part 110 again,holds new devices, and moves to the first DC testing part 131 forcarrying out DC testing.

While the first DC testing part 131 carries out the DC testing, thefirst unlading buffer 141 moves to the main working line ML, and standsby for receiving the device.

In the meantime, of the first, and second insert/remove pickers 162, and163 moved to the left side of the drawing, the first insert/removepicker 162 is positioned over the burn-in board at the working post WP,and the second insert/remove picker 163 is positioned over the secondunloading buffer 142.

Then, both the first, and second insert/remove pickers 162, and 163 movedown at the same time, to load new devices on the burn-in board ‘B’, andtested devices on the second unloading buffer 142.

Thereafter, the second DC testing part 132 moves to the main workingline ML again. At the same time with this, the burn-in board also movesby one step to expose the next tested device to the working post WP.

Once this operation is finished, the first, and second insert/removepickers 162 and 163 move down at the same time, so that the secondinsert/remove picker 163 holds a new device on the second DC testingpart 132, and the first insert/remove picker 162 holds the device on theburn-in board ‘B’ at the working post WP.

The first, and second insert/remove pickers 162, and 163 move up again,and move along the X-axis main shaft 160 to a right side of the drawingwhen the drawing is seen from above, so that the second inert/removepicker 163 inserts a new device in the burn-in board at the workingpost, and the first insert/remove picker 162 places tested device on thefirst unloading buffer 141.

Once the first, and second insert/remove pickers 162, and 163 move tothe right side of the drawing, the second unloading buffer 142 moves tothe main working line ML again, and the second loading/unloading picker164 moves to the second unloading buffer 142, holds the tested device,moves to the second unloader part 125, and places good devices on thetray.

Then, the second loading/unloading picker 164 moves to the second loaderpart 120, and holds a new device, when the second DC testing part 132moves to the main working line ML again, so that the secondloading/unloading picker 164 transfers the new device to the second DCtesting part 132, to carry out DC test. When the DC test is finished,the second unloading buffer 142 moves to the main working line ML, andstands by.

In the meantime, as described before, the first, and secondinsert/remove pickers 162, and 163 load the devices on the firstunloading buffer 141, and the burn-in board ‘B’, and, the same as theprocess described before, the DC testing part 131 moves to the mainworking line ML, and the burn-in board ‘B’ moves by one step, underwhich state the first, and second insert/remove pickers 162, and 163move down again, and hold new devices at the first DC testing part 131,and the tested devices on the burn-in board ‘B’ respectively, and moveto the left side of the drawing, and load the devices on the burn-inboard ‘B’, and the second unloading buffer 142, respectively.

Processes hereafter are the same with the foregoing processes, and thesorting handler of the present invention repeats the foregoing processcontinuously, to replace the devices.

In summary of the sorting process, the first, and secondloading/unloading pickers 161, and 164 carries out processes accordingto a given sequence continuously, and repeatedly, in which the first,and second loading/unloading pickers 161, and 164 transfer new devicesfrom the first, and second unloader parts 110, and 120, and transferburn-in tested good devices from the first, and second unloading buffer141, and 142 to the first, and second unloader parts 115, and 125, andplaces on the tray. In this instance, the first, and second DC testingparts 131, and 132 and the first, and second unloading buffers 141, and142 move back and forth between the main working line ML, and thesorting line SL continuously, receive new devices and tested devicesfrom the first, and second loading/unloading pickers 161, and 164 andthe first, and second insert/remove pickers 162, and 163, and carry outDC test and stand by for device unloading, respectively.

The first insert/remove picker 162, and the second insert/remove picker163 place devices on the first unloading buffer 141 and the burn-inboard ‘B’ respectively, move up, and move down right away, holds devicesat the first DC testing part 131 and the burn-in board ‘B’ respectively,move to the left side of the drawing, place the devices on the secondunloading buffer 142 and the burn-in board ‘B’, move up, move down rightaway, hold the device at the second DC testing part 132 and the burn-inboard ‘B’, move to the right side of the drawing which is an oppositeside, and to carry out the foregoing processes repeatedly, andcontinuously.

Thus, because the first, and second insert/remove pickers 162, and 163always hold devices picked up from opposite sides of the working post WPin a bi-directional movement along the X-axis main shaft 160, withouthaving sections moving with empty handed, an overall working efficiencyis improved.

In the meantime, if there is defective device found during the DCtesting process, the main pneumatic cylinder 135 is operated, to movethe first, or second DC testing part 132 to the sorting line SL, and thesorting picker 165 moves to the sorting line SL along the sorting X-,and Y-axis shafts 170, holds the defective device at the first DCtesting part 131 or the second DC testing part 132, and places on thetray of the sorting part 150.

Then, the first, or second DC testing part 132 moves to the main workingline again, the first or second loading/unloading picker 164 puts newdevices in empty pockets of the first or second DC testing part 132, theDC test is carried out again to inspect for defect, and the processproceeds to the next step.

If defective devices are transferred from the burn-in board ‘B’ to thefirst, or second unloading buffer 141 or 142, the buffer having thedefective device placed thereon is moved to the sorting line SL by theindividual pneumatic cylinder 145.

Then, the sorting picker 165 moves to the sorting line SL along thesorting X-, and Y-axis shafts 170, holds the devices on the first, orsecond unloading buffer 141, or 142, moves along the sorting X-, andY-axis shafts 170, and places the defective devices on a relevant tray‘T’.

During the device sorting is carried out at the burn-in board, thedevices are unloaded from the first loader part 110 and the secondloader part 120 entirely, and empty trays of the first loader part 110and the second loader part 120 are transferred to rear most parts of thefirst and second loader parts 110 and 120, loaded on the tray stackers112 and 122, temporarily, and, therefrom, transferred to the traystackers 117 and 127 of the first and second unloader parts 115 and 125by the first and second transferors 181, and 182.

Therefore, even if no additional trays are supplied to the first, andsecond unloader parts 115, and 125, the first, and second unloader parts115, and 125 are still operative by using the trays from the first, andsecond loader parts 110, and 120.

The foregoing description on operation of the sorting handler is on aprocess for carrying out so called simultaneous INSERT & REMOVE in whichthe burn-in tested devices are removed from the burn-in board ‘B’ forsorting, and, at the same time with this, new devices are inserted tothe burn-in board ‘B’.

Other thah the simultaneous insert & remove, when it is intended only toload new devices on the burn-in board ‘B’ ‘INSERT ONLY’, or only tounload burn-in tested devices from the burn-in board ‘REMOVE ONLY’, thedevice insert and remove can be carried out with a process simpler thanthe simultaneous INSERT & REMOVE.

For an example, if it is intended to carry out the ‘INSERT ONLY’, notrays are loaded on the first, and second unloader parts 115, and 125,but trays having new devices placed thereon are loaded only on thefirst, and second loader parts 110, and 120.

Then, upon putting the sorting handler into operation after loadingempty burn-in boards without the devices on the rack 200, the X-Y-θtable 105 draws the burn-in board ‘B’ from the rack 200, transfers tothe working post WP, turns the burn-in board ‘B’ at 90°, and stands by.

Since the first, and second unloading buffers 141, and 142 are notrequired when it is intended to carry out the INSERT ONLY, the first,and second DC testing parts 131, and 132 are fixed at the main workingline ML, a position of the first, and second DC testing parts 131, and132 at an initial starting of the sorting handler, until the INSERT ONLYis finished.

If the trays are transferred from the first, and second loader parts 110and 120 to the main working line ML starting from the tray ‘T’ at thelowest position in succession, the first, and second unloading pickers161, and 164 pick up, and hold new devices from the first, and secondloader parts 110, and 120 at opposite ends of the main working line ML,transfer to, and load on the first, and second DC testing parts 131, and132, to carry out DC test of the devices.

In this instance, the first, and second loading/unloading pickers 161,and 164 move to the first, and second loader parts 110, and 120 atopposite sides of the body 101 again, hold devices, and stand by.

If the DC test is finished at the first, and second DC testing parts131, and 132, the first, and second insert/remove pickers 162, and 163move to the right side of the drawing, and the first insert/removepicker 162 holds the devices on the first DC testing part 131.

Then, the first, and second insert/remove pickers 162, and 163 move tothe left side of the drawing again, and loads the devices on the burn-inboard ‘B’, and, at the same time with this, the second insert/removepicker 163 holds the devices on the second DC testing part 132.

Then, the first, and second insert/remove pickers 162, and 163 move tothe right side of the drawing, the second insert/remove picker 163 loadsthe devices on the burn-in board ‘B’, and, at the same time with this,the first insert/remove picker 162 holds the devices on the first DCtest part 131.

Thus, when the INSERT ONLY is carried out, the first, and secondinsert/remove pickers 162, and 163 supply devices to the first, andsecond DC parts 131, and 132 continuously, and the first, and secondinsert/remove pickers 162, and 163 only carry out a work repeatedly, andcontinuously, in which the devices supplied to the first, and second DCtesting parts 131, and 132 are loaded on the burn-in board ‘B’ whilemoving in both directions.

In the meantime, also when the REMOVE ONLY is carried out, in which onlytested devices are removed from the burn-in board ‘B’, the REMOVE ONLYcan be carried out in a process similar to above.

In this case, the first, and second DC testing parts 131 and 132 are notpositioned not at the main working line, but the first, and secondunloading buffers 141, and 142 are fixed to and use at the main workingline ML, the first, and second insert/remove pickers 162, and 163 movein both directions, and transfer tested devices from the burn-in board‘B’ to the first, and second unloading buffers 141, and 142 on bothsides of the burn-in board ‘B’, and the first, and secondloading/unloading pickers 161, and 164 transfer the devices on thefirst, and second unloading buffers 141, and 142 to the trays on thefirst, and second unloader parts 115, and 125, and load thereon.

In the meantime, even though the foregoing embodiment of the sortinghandler for a burn-in tester suggests that, if the defective device isfound at the DC testing part, the entire DC testing part moves to thesorting line, removes only the defective device, and insert a new deviceonly in the space, for carrying out the DC test again, different fromthis, it may be possible that a DC buffer part may be arranged on oneside of each of the first, and second DC testing parts 131, and 132additionally, so that, if there is a defective device found at the DCtesting parts, the defective device is removed from the DC testing part,and transferred to the sorting part, good devices are loaded on thebuffer parts temporarily, for transferring the good devices to theburn-in board, separately.

As has been described, because the two insert/remove pickers, which isto remove, and transfer tested devices from the burn-in board, and hold,and transfer new devices from the DC testing part or the buffer, canhold, and transfer devices whenever the two insert/remove pickers movein both directions of the body, a rate of sorting can be improved,significantly.

It will be apparent to those skilled in the art that variousmodifications and variations can be made in the present inventionwithout departing from the spirit or scope of the invention. Thus, it isintended that the present invention cover the modifications andvariations of this invention provided they come within the scope of theappended claims and their equivalents.

1. A sorting handler for handling electronic devices, comprising: atleast one loader configured to interface with a stacker that holds traysbearing electronic devices; a holder configured to receive, temporarilyhold, and release electronic devices that are traveling in a firstdirection and a second direction; a table configured to carry andposition a rack for receiving the electronic devices; and at least oneloading/unloading picker configured to transport the electronic devicesbetween the loader, the holder and the rack.
 2. The sorting handler ofclaim 1, wherein the holder comprises at least one testing part, and atleast one buffer part, for the electronic devices.
 3. The sortinghandler of claim 2, wherein the at least one testing part receives,temporarily holds, and releases the electronic devices that are beingtransported in one of the first and second travel directions, andwherein the at least one buffer part receives, temporarily holds, andreleases electronic devices that are traveling in the other of the firstand second travel directions.
 4. The sorting handler of claim 3, whereinthe holder comprises a shifter that is configured to alternately alignthe at least one testing part and the at least one buffer part with amain line, along which the at least one loading/unloading picker moves.5. The sorting handler of claim 4, wherein the holder further comprisesa second shifter configured to align the at least one buffer part with asorting line.
 6. The sorting handler of claim 5, wherein the at leastone buffer part comprises a plurality of buffers, each buffer beingconfigured to hold at least one of the electronic devices, and whereinthe second shifter comprises a plurality of actuators, wherein eachactuator is configured to align a corresponding buffer with the sortingline.
 7. The sorting handler of claim 4, further comprising a sortingpicker which moves along the sorting line, wherein the sorting picker isconfigured to transport electronic devices between the at least onebuffer of the holder, and a plurality of sorting trays.
 8. The sortinghandler of claim 1, further comprising at least one unloader configuredto interface with the stacker that holds trays bearing electronicdevices, wherein the at least one loading/unloading picker is alsoconfigured to transport electronic devices to the unloader.
 9. Thesorting handler of claim 8, wherein the at least one loader comprisesfirst and second loaders, wherein the at least one unloader comprisesfirst and second loaders, and wherein the at least one loading/unloadingpicker comprises first and second loading/unloading pickers.
 10. Asorting handler, comprising: first and second loading/unloading systemslocated on opposite sides of a central loading area where a burn-inboard is located, wherein each of the first and second loading/unloadingsystems is configured to transport a plurality of electronic devices ina first direction and a second direction along a main working line,wherein each loading/unloading system comprises: a loader configured totransfer trays provided with a plurality of electronic devices from aninput stacker to a position along the main working line, an unloaderconfigured to transfer trays from a position along the main working lineto an output stacker, a holder configured to temporarily hold electronicdevices adjacent the central loading area, a first picker configured tomove along the main working line alternately in first and second traveldirections while carrying electronic devices between the loader, theholder and the unloader, and a second picker configured to move alongthe main working line alternately in the first and second traveldirections while carrying the plurality of the electronic devicesbetween the holder and the burn-in board located at the central loadingarea.
 11. The sorting handler of claim 10, wherein the holder includesan input buffer for momentarily holding the electronic devices.
 12. Thesorting handler of claim 11, wherein the input buffer has test socketsfor testing the electronic devices.
 13. The sorting handler of claim 11,wherein the holder includes an output buffer for momentarily holding theelectronic devices.
 14. The sorting handler of claim 13, wherein theholder is configured to alternately align the input buffer and theoutput buffer with the main working line.
 15. The sorting handler ofclaim 14, further comprising: a table configured to align with the mainworking line and the second picker, and configured to support and movethe burn-in board.
 16. The sorting handler of claim 15, furthercomprising: a main shaft, wherein the main shaft is aligned with themain working line.
 17. The sorting handler of claim 16, wherein the mainshaft supports the first and second pickers.
 18. The sorting handler ofclaim 10, wherein the holder comprises: a testing part configured tohold the plurality of electronic devices traveling in the first traveldirection; and a buffer configured to hold the plurality of electronicdevices traveling in the second travel direction.
 19. The sortinghandler of claim 18, wherein the testing part of the holder isconfigured to test the plurality of electronic devices.
 20. The sortinghandler of claim 18, wherein the first travel direction of the pluralityof electronic devices takes the plurality of electronic devices from thefirst loader to the holder.
 21. The sorting handler of claim 20, whereinthe second travel direction of the plurality of electronic devices takesthe plurality of electronic devices from the holder to the unloader. 22.The sorting handler of claim 18, wherein the holder is configured toalternately align the testing part and the buffer with the main workingline.
 23. The sorting handler of claim 22, wherein the holder is alsoconfigured to align the buffer with a sorting line.
 24. The sortinghandler of claim 23, further comprising a sorting picker configured totransfer electronic devices from the buffer to a plurality of sortingtrays.
 25. The sorting handler of claim 23, wherein the holder comprisesa first actuator configured to alternately align the testing part andthe buffer with the main working line.
 26. The sorting handler of claim25 wherein the buffer comprises a plurality of holders, each of which isconfigured to hold at least one of the electronic devices, and whereinthe holder further comprises a plurality of second actuators, each ofwhich is configured to align a corresponding holder with the sortingline.